Analyze samples

Profile Setup

Product
SIEMENS Inspekto VIS system
Product Version
6.0
Language
en-US

This is an automated step in which the SIEMENS Inspekto VIS system performs all necessary calculations to prepare the profile for inspection.

In some cases, after the calculations have been completed, the SIEMENS Inspekto VIS system will show samples with a high probability of anomalies.

These are samples in which the SIEMENS Inspekto VIS system has found suspected defects even though they were added as OK samples.

The SIEMENS Inspekto VIS system will ask you to check whether the sample presented is OK or NOK.

For example, the following sample has a suspected anomaly that is not a true defect:



In this case click the green OK button at the bottom center of the screen.

In cases where the presented image has a true defect, click the red NOK button:

This will add an NOK sample to the profile.



  • NOK samples help the SIEMENS Inspekto VIS system increase the sensitivity for specific types of defects without compromising the sensitivity of any other type of defect.

  • After clicking the red NOK button, you can edit the defect markings on the image.

    • Editing these markings can help the SIEMENS Inspekto VIS system better find these kinds of defects in the future.

  • The defect markings are edited in the same way as any other marking. When you enter this option, the SIEMENS Inspekto VIS system will display the marking panel with an additional “Defects” section:



  • When you have finished editing, click the “Save” button.

    • After adding NOK samples, the SIEMENS Inspekto VIS system will perform the “analyze samples” step again.

Parent topic: Creating an inspection profile